Electronic components have a wide range of failure modesthese can be classified in various ways such as by time or cause failures can be caused by excess temperature excess current or voltage ionizing radiation mechanical shock stress or impact and many other causesin semiconductor devices problems in the device package may cause failures due to contamination mechanical stress of . Electrical overstress eos is a common failure cause for many of the electronic circuits today the failure analyst has no difficulty identifying eos as the cause of the failure. 1 introduction for 40 years electrical overstress eos is one of the major reasons for failures of semiconductor devices in manufacturing processes and in the field although there is a broad agreement in the electronics industry that eos failures are a persistent problem that needs to be solved and despite significant effort spent in this field there has not been much success . Electrical overstress eos continues to impact semiconductor manufacturing semiconductor components and systems as technologies scale from micro to nano electronics this bookteaches the fundamentals of electrical overstress and how to minimize and mitigate eos failures the text provides a clear picture of eos phenomena eos origins eos . Electrical overstress or eos is a phenomenon where electrical signals applied to a circuit or a device exceed normal operating parameters these excessive electrical signals are abnormal by definition and are not a part of normal operation of the devices according to intel eos is the number one cause of damage to ic components
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